Fast compressed channeled spectropolarimeter for full Stokes vector measurement

Guodong Zhou; Yanqiu Li; Jianhui Li; Jiazhi Wang

doi:10.1117/12.2526089

21 June 2019 Fast compressed channeled spectropolarimeter for full Stokes vector measurement

Guodong Zhou, Yanqiu Li, Jianhui Li, Jiazhi Wang

Proceedings Volume 11057, Modeling Aspects in Optical Metrology VII; 110570T (2019) https://doi.org/10.1117/12.2526089
Event: SPIE Optical Metrology, 2019, Munich, Germany

Abstract

Channeled spectropolarimeter (CSP) measures the spectrally resolved Stokes vector of light from only one single spectral acquisition, which makes it possible to accurately measure dynamic events. The accurate reconstruction of Stokes vector plays a key role in this snapshot technique shifting the main burden of measurement to computational work. The state-ofthe-art algorithm runs the Fourier transform of the channeled spectrum or linear operator model of the system and its pseudo-inverse to reconstruct Stokes vector. However, they may suffer from the lack of signal-to-noise ratio (SNR) then reduce the accuracy of reconstruction. To accurately reconstruct Stokes vector from noise-contaminated data, we propose an effective method called fast compressed channeled spectropolarimeter (FCCSP). In our FCCSP method, the spectrum from spectrometer is seen as the compressive representation of Stokes vector, thus the FCCSP algorithm is to solve an underdetermined problem, where we reconstruct the 4N×1 Stokes vector from only N×1 spectral data acquisition points. Simulation results show that our FCCSP method is more accurate to reconstruct Stokes vector changing gradually with wavelength from noise-contaminated spectrum than Fourier and linear operator methods. Besides, it is faster and more memory and computation-friendly than other compressed CSP method.

Citation Download Citation

Guodong Zhou, Yanqiu Li, Jianhui Li, and Jiazhi Wang "Fast compressed channeled spectropolarimeter for full Stokes vector measurement", Proc. SPIE 11057, Modeling Aspects in Optical Metrology VII, 110570T (21 June 2019); https://doi.org/10.1117/12.2526089

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