Measuring bidirectional reflectance distribution of low reflectivity surfaces in the near infrared

Luan C. Doan; J. Robert Mahan; Kory J. Priestley; Nguyen Q. Vinh

doi:10.1117/12.2529629

11 September 2019 Measuring bidirectional reflectance distribution of low reflectivity surfaces in the near infrared

Luan C. Doan, J. Robert Mahan, Kory J. Priestley, Nguyen Q. Vinh

Proceedings Volume 11103, Optical Modeling and System Alignment; 111030I (2019) https://doi.org/10.1117/12.2529629
Event: SPIE Optical Engineering + Applications, 2019, San Diego, California, United States

Abstract

Knowledge of bidirectional reflectance angular distribution of low reflectivity surfaces is important for predicting stray light in optical systems. We have performed bidirectional reflectance distribution measurements at wavelengths of 633 nm and 850 nm for surfaces coated with Z302, a commercial optical coating material widely used in optical instruments. The bidirectional reflectance properties of these surfaces depend on surface topology characterized by thickness and roughness parameters. To explain our results, we have employed directional scatter analysis of the experimental data that can be represented by a linear combination of diffuse, glossy, and specular, components. Modeling the bidirectional reflectance distribution in the context of a ray-trace can provide important information of stray light, coated surfaces, and their impact on performance of optical instruments.

Citation Download Citation

Luan C. Doan, J. Robert Mahan, Kory J. Priestley, and Nguyen Q. Vinh "Measuring bidirectional reflectance distribution of low reflectivity surfaces in the near infrared", Proc. SPIE 11103, Optical Modeling and System Alignment, 111030I (11 September 2019); https://doi.org/10.1117/12.2529629

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