Open Access Paper
2 October 2019 Front Matter: Volume 11108
Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 11108, including the Title Page, Copyright information, Table of Contents, Author and Conference Committee lists

The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at SPIEDigitalLibrary.org.

The papers reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon.

Please use the following format to cite material from these proceedings:

Author(s), “Title of Paper,” in Advances in X-Ray/EUV Optics and Components XIV, edited by Ali M. Khounsary, Shunji Goto, Christian Morawe, Proceedings of SPIE Vol. 11108 (SPIE, Bellingham, WA, 2019) Seven-digit Article CID Number.

ISSN: 0277-786X

ISSN: 1996-756X (electronic)

ISBN: 9781510629097

ISBN: 9781510629103 (electronic)

Published by

SPIE

P.O. Box 10, Bellingham, Washington 98227-0010 USA

Telephone +1 360 676 3290 (Pacific Time)· Fax +1 360 647 1445

SPIE.org

Copyright © 2019, Society of Photo-Optical Instrumentation Engineers.

Copying of material in this book for internal or personal use, or for the internal or personal use of specific clients, beyond the fair use provisions granted by the U.S. Copyright Law is authorized by SPIE subject to payment of copying fees. The Transactional Reporting Service base fee for this volume is $21.00 per article (or portion thereof), which should be paid directly to the Copyright Clearance Center (CCC), 222 Rosewood Drive, Danvers, MA 01923. Payment may also be made electronically through CCC Online at copyright.com. Other copying for republication, resale, advertising or promotion, or any form of systematic or multiple reproduction of any material in this book is prohibited except with permission in writing from the publisher. The CCC fee code is 0277-786X/19/$21.00.

Printed in the United States of America by Curran Associates, Inc., under license from SPIE.

Publication of record for individual papers is online in the SPIE Digital Library.

00005_PSISDG11108_1110801_page_2_1.jpg

Paper Numbering: Proceedings of SPIE follow an e-First publication model. A unique citation identifier (CID) number is assigned to each article at the time of publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online and print versions of the publication. SPIE uses a seven-digit CID article numbering system structured as follows:

  • The first five digits correspond to the SPIE volume number.

  • The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc. The CID Number appears on each page of the manuscript.

Authors

Numbers in the index correspond to the last two digits of the seven-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first five digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc.

Asakawa, Y., 0P, 0V

Barrett, R., 07

Blazek, Martin, 0W

Braig, Christoph, 0J

Chapman, Dean, 0E

Chen, Pice, 0B

Cremer, J. T., 0Q

Ding, Hong, 0U

Doi, K., 0P, 0V

Dudchik, Yu. I., 0Q

Egawa, S., 04

Erko, Alexei, 0J

Gary, C. K., 0Q

Harada, Y., 0P, 0V

Hashizume, H., 06

Hata, R., 0P, 0V

Havlikova, R., 0Y

Hiraguri, K., 06

Hudec, Rene, 0W, 0Y

Imamura, Y., 06

Inneman, Adolf, 0W, 0Y

Itoh, H., 0P, 0V

Jark, W., 0K

Kishimoto, H., 06

Kodaka, H., 0P, 0V

Kubota, Y., 04

Kume, T., 06

Labouré, S., 07

Löchel, Heike, 0J

Lopez, Daniel, 0B

Marsikova, V., 0Y

Matsuzawa, Y., 06

Mimura, H., 04, 06

Miyashita, H., 06

Morawe, Ch., 07

Motoyama, H., 04

Mukoda, T., 06

Nawaki, Y., 0P, 0V

Nentvich, Ondrej, 0W

Nomoto, K., 0P, 0V

Oberta, P., 0Y

Ohashi, H., 04, 06

Owada, S., 04

Padmore, Howard A., 0N

Pantell, R. H., 0Q

Park, Sooyeon, 0N

Peffen, J-Ch., 07

Perrin, F., 07

Piestrup, M. A., 0Q

Pina, L., 0Y

Qi, Peng, 0E

Rademacher, R., 0Q

Reininger, Ruben, 0U

Samadi, Nazanin, 0E

Senba, Y., 06

Shi, Xianbo, 0E, 0U

Shi, Yingbo, 0U

Shimamura, T., 06

Sieger, Ladislav, 0W

Takeo, Y., 06

Tono, K., 04

Tsuruoka, K., 0P, 0V

Uetsuki, K., 0P, 0V

Urban, Martin, 0W

Vivo, A., 07

Voronov, Dmitriy L., 0N

Walko, Donald A., 0B

Wang, Jin, 0B

Wang, Yong, 0U

Yabashi, M., 04

Yamaguchi, G., 04, 06

Conference Committee

Program Track Chairs

  • Ali M. Khounsary, Illinois Institute of Technology (United States)

  • Ralph B. James, Savannah River National Laboratory (United States)

Conference Chairs

  • Ali M. Khounsary, Illinois Institute of Technology (United States)

  • Shunji Goto, Japan Synchrotron Radiation Research Institute (Japan)

  • Christian Morawe, ESRF - The European Synchrotron (France)

Conference Program Committee

  • Lucia Alianelli, Diamond Light Source Ltd. (United Kingdom)

  • Lahsen Assoufid, Argonne National Laboratory (United States)

  • Stefan Braun, Fraunhofer IWS Dresden (Germany)

  • Daniele Cocco, Lawrence Berkeley National Laboratory (United States)

  • Raymond P. Conley Jr., Argonne National Laboratory (United States)

  • Christian David, Paul Scherrer Institut (Switzerland)

  • Hans M. Hertz, KTH Royal Institute of Technology (Sweden)

  • Werner H. Jark, Elettra-Sincrotrone Trieste S.C.p.A. (Italy)

  • George A. Kyrala, Los Alamos National Laboratory (United States)

  • Eric Louis, Universiteit of Twente (Netherlands)

  • Hidekazu Mimura, The University of Tokyo (Japan)

  • Patrick P. Naulleau, Lawrence Berkeley National Laboratory (United States)

  • Haruhiko Ohashi, Japan Synchrotron Radiation Research Institute (JASRI) (Japan)

  • Ladislav Pina, Czech Technical University in Prague (Czech Republic)

  • Yuriy Y. Platonov, Rigaku Innovative Technologies, Inc. (United States)

  • Regina Soufli, Lawrence Livermore National Laboratory (United States)

  • Daniele Spiga, SLAC National Accelerator Laboratory (United States)

  • Stanislav Stoupin, Cornell University (United States)

  • Mau-Tsu Tang, National Synchrotron Radiation Research Center (Taiwan)

  • Akihiko Ueda, JTEC Corporation (Japan)

  • Zhanshan Wang, Tongji University (China)

  • Makina Yabashi, RIKEN (Japan) and Japan Synchrotron Radiation Research Institute (Japan)

  • Kazuto Yamauchi, Osaka University (Japan)

  • Brian W. Yates, Canadian Light Source Inc. (Canada)

Session Chairs

  • 1 Mirrors

    Christian Morawe, ESRF - The European Synchrotron (France)

    Dmitriy L. Voronov, Lawrence Berkeley National Laboratory (United States)

  • 2 Thin Films and Multilayers

    Werner H. Jark, Elettra-Sincrotrone Trieste S.C.p.A. (Italy)

    Yuri V. Shvyd’ko, Argonne National Laboratory (United States)

  • 3 Crystals

    Shunji Goto, Japan Synchrotron Radiation Research Institute (JASRI) (Japan)

    Andrey A. Sokolov, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH (Germany)

  • 4 Simulations

    Ali M. Khounsary, Illinois Institute of Technology (United States)

    Werner H. Jark, Elettra-Sincrotrone Trieste S.C.p.A. (Italy)

  • 5 Gratings

    Shunji Goto, Japan Synchrotron Radiation Research Institute (JASRI) (Japan)

    Daniele Spiga, SLAC National Accelerator Laboratory (United States)

  • 6 Capillaries and Refractive Optics

    Alexei Erko, Institute für angewandte Photonik e. V. (Germany)

    Ali M. Khounsary, Illinois Institute of Technology (United States)

© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 11108", Proc. SPIE 11108, Advances in X-Ray/EUV Optics and Components XIV, 1110801 (2 October 2019); https://doi.org/10.1117/12.2551638
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
X-ray optics

X-ray diffraction

X-ray microscopy

Alternate lighting of surfaces

Synchrotron radiation

X-ray imaging

X-rays

Back to Top