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9 September 2019 Proton radiation damage experiment on an x-ray hybrid CMOS detector (Conference Presentation)
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Abstract
Understanding the effects of high energy proton radiation is essential in planning for the next generation of X-ray space telescopes. We report on the results of an experiment in which an X-ray hybrid CMOS detector was incrementally irradiated with 8 MeV protons up to a total absorbed dose of approximately 3 krad(Si) (4.5 x 109 protons/cm2). The effect of the damage caused by the high energy protons is then analyzed in the context of several detector characteristics, including read noise, dark current, and energy resolution.
Conference Presentation
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Evan Bray, Abraham D. Falcone, Mitchell Wages, David N. Burrows, Carl R. Brune, and Zach Meisel "Proton radiation damage experiment on an x-ray hybrid CMOS detector (Conference Presentation)", Proc. SPIE 11118, UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XXI, 1111804 (9 September 2019); https://doi.org/10.1117/12.2528842
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KEYWORDS
X-rays

CMOS sensors

X-ray detectors

Sensors

Space telescopes

X-ray telescopes

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