Polycrystalline (Sb,Bi)2Se3 thin film layers for SWIR detection

Thomas P. Weiss; Michele Melchiorre; Panagiota Arnou; Nathalie Valle; Phillip J. Dale; Susanne Siebentritt

doi:10.1117/12.2529326

9 September 2019 Polycrystalline (Sb,Bi)₂Se₃ thin film layers for SWIR detection

Thomas P. Weiss, Michele Melchiorre, Panagiota Arnou, Nathalie Valle, Phillip J. Dale, Susanne Siebentritt

Proceedings Volume 11129, Infrared Sensors, Devices, and Applications IX; 1112904 (2019) https://doi.org/10.1117/12.2529326
Event: SPIE Optical Engineering + Applications, 2019, San Diego, California, United States

Abstract

Polycrystalline thin films of (Sb_0.42Bi_0.58)₂Se₃ are prepared by co-evaporation in a two-step process. First, the semiconducting layer is grown at 240°C. Subsequently the films are annealed in-situ at various temperatures. The incorporation of Bi into the orthorhombic Sb₂Se₃ system reduces the bandgap and thus widens the range for infrared detection. It is found that thin film layers can be prepared single phase, while a decomposition is observed for temperatures exceeding 440°C, where the rhombohedral structure of Bi₂Se₃ forms in addition. Photoluminescence measurements show an increased optoelectronic quality of the films with increasing annealing temperature. However, the luminescence signal reduces when the films decompose into the orthorhombic and the rhombohedral phases.

Conference Presentation

Citation Download Citation

Thomas P. Weiss, Michele Melchiorre, Panagiota Arnou, Nathalie Valle, Phillip J. Dale, and Susanne Siebentritt "Polycrystalline (Sb,Bi)₂Se₃ thin film layers for SWIR detection", Proc. SPIE 11129, Infrared Sensors, Devices, and Applications IX, 1112904 (9 September 2019); https://doi.org/10.1117/12.2529326

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