Presentation + Paper
10 October 2019 The bidirectional reflectance of black silicon used in space and Earth remote sensing applications
Author Affiliations +
Abstract
Space-based astrophysical and remote sensing observations often require the detection and measurement of light originating from distant and relatively faint objects. These observations are highly susceptible to scattered light which may introduce imaging artifacts, obscure object details, and increase measurement noise. This paper describes the initial work of characterizing representative black materials used in coronagraph instruments and other spaceborne instruments. Measurements of “blackness” and the achieved reflectance of black silicon are provided in the spectral range from 400nm to 2500nm using 8o directional hemispherical measurements. The bidirectional reflectance of black silicon was also measured at discrete wavelengths, 633nm, and 1064nm, using the optical scatterometer located at NASA Goddard Space Flight Center’s Diffuser Calibration Laboratory (DCL). A 100mm diameter black silicon sample was fabricated and optically characterized. The BRDF of other well-known black materials such as Z306 and Fractal Black are also presented and discussed.
Conference Presentation
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Georgi T. Georgiev, James J. Butler, Ron Shiri, Christine A. Jhabvala, Edward J. Wollack, and Elena M. Georgieva "The bidirectional reflectance of black silicon used in space and Earth remote sensing applications", Proc. SPIE 11151, Sensors, Systems, and Next-Generation Satellites XXIII, 111511E (10 October 2019); https://doi.org/10.1117/12.2534799
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Silicon

Reflectivity

Remote sensing

Coronagraphy

Bidirectional reflectance transmission function

Calibration

Aerospace engineering

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