Open Access Paper
16 July 2019 Front Matter: Volume 11172
Proceedings Volume 11172, Fourteenth International Conference on Quality Control by Artificial Vision; 1117201 (2019) https://doi.org/10.1117/12.2540539
Event: Fourteenth International Conference on Quality Control by Artificial Vision, 2019, Mulhouse, France
Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 11172 including the Title Page, Copyright information, Table of Contents, Introduction, and Conference Committee listing.

The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at SPIEDigitalLibrary.org.

The papers reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon.

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Author(s), “Title of Paper,” in Fourteenth International Conference on Quality Control by Artificial Vision, edited by Christophe Cudel, Stéphane Bazeille, Nicolas Verrier, Proceedings of SPIE Vol. 11172 (SPIE, Bellingham, WA, 2019) Seven-digit Article CID Number.

ISSN: 0277-786X

ISSN: 1996-756X (electronic)

ISBN: 9781510630536

ISBN: 9781510630543 (electronic)

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Authors

Numbers in the index correspond to the last two digits of the seven-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first five digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc.

Ainouz, Samia, 18

Aizawa, Hiroaki, 0O, 0T

Aldea, Emanuel, 10

Alfalou, Ayman, 0Z

Angulo, Xabier, 0L

Arana-Arexolaleiba, Nestor, 09

Asama, Hajime, 0X

Aubreton, Olivier, 15, 1E

Baghbanpourasl, Amirreza, 0E

Balzategui, Julen, 09

Barre, Anne-Laure, 0C

Bätz, Michel, 1C

Bazeille, Stéphane, 0W

Beauseroy, P., 0G

Belhadj, Djallel, 07, 0S, 1H

Ben Adallah, Hamdi, 0U

Bertolino, Pascal, 05

Bigué, Laurent, 16

Blanchon, Marc, 0M

Blin, Rachel, 18

Bolomey, LĂ©andre, 1B

Boroomandi Barati, Solmaz, 0R

Bouabdellah, Mohamed, 0N

Boucher, Arnaud, 0A

Bringier, Benjamin, 0Q

Brost, Vincent, 0A

Canu, Stéphane, 18

Capitao, Flavio, 1B

Castro, Yuly, 0A, 13

Cenedese, Angelo, 0H

Chambard, Jean-Pierre, 0V

Chowdhary Maddukuri, Sriniwas, 0E

Chuchvara, Alexandra, 1C

Cudel, Christophe, 0N, 0V, 0W

Debailleul, M., 0F

Deborah, Hilda, 11

De Laulanié, Lucie, 0C

del Barrio, Jon Ander, 0L

Devy, Michel, 08

Dolives, Benoit, 0U

Dondi, Piercarlo, 10

Eciolaza, Luka, 09

Eitzinger, Christian, 0E, 1G

El Kabir, Taoufik, 0Q

Errami, Mounir, 0K

Fantinel, Riccardo, 0H

Favrelière, H., 13, 17

Fernandez-Maloigne, C., 1F

Fofi, David, 0M

Foucault, L., 0F

Foulonneau, Alban, 16

GarcĂ­a de la Yedra, Aitor, 0L

Gavet, Yann, 0R

Giménez, Yilbert, 16

Gomez, Ietxu, 1B

Goto, Keisuke, 0T

Granberg, P., 0J

Haboub, Abdelmoula, 0K

Haddad, Madjid, 07, 0S, 1H

Haeberlé, O., 0F

Hardeberg, Jon Yngve, 11

Hase, Natsuki, 06

Heindl, Christoph, 1G

Herbulot, Ariane, 08

Herrmann, Thomas, 1E

Hirsch, Ernest, 04

Ihrke, Ivo, 03

Ito, Seiya, 06, 1A

Jaschke, Tobias, 1C

Jauch, C., 0P

Jebali, H., 1F

Jégou, Jean-François, 0Q

Ji, Yonghoon, 0X, 14

Jovančević, Igor, 0U

Kaneko, Naoshi, 06, 1A

Kaneko, Shun’ichi, 12

Kato, Kunihito, 0O, 0T

Keinert, Joachim, 1C

Khoudeir, Majdi, 0Q

Lacombe, T., 17

Ladret, Patricia, 05

Langlois, J., 0I

Lapray, Pierre-Jean, 16

Larnier, Stanislas, 08

Launay, Aurélien, 04

Lechervy, Alexis, 0Z

Lecron, Jean-Claude, 0Q

Lee, Eui-Hyuk, 1D

Le Goïc, Gaëtan, 0A, 13

Le HĂ©garat, Sylvie, 10

Leporcq, Florian, 0Z

Maestro-Watson, Daniel, 09

Maillot, Yvan, 0V

Malagodi, Marco, 10

Mansouri, Alamin, 0A, 13

Marino, S., 0G

Martin, Hélène, 0R

Masenlle, Manuel, 0L

Mathieu, A., 15

Matsuoka, Yuki, 0O

Meguenani, Anis, 0V

Meriaudeau, Fabrice, 18

Meyer-Heye, Pauline, 0E

Migniot, Cyrille, 1E

Minematsu, T., 0J

Miranda, Julien, 08

Monnin, David, 0W

Morel, Franck, 0Q

Moreno, RamĂłn, 0L

Mori, Naoyuki, 0B

Mosqueron, Romuald, 1B

Mouchère, H., 0I

Muller, T., 17

Muniategui, Ander, 0L

Muzeau, Julien, 05

Nagorny, P., 17

Nakatsuka, Shunsuke, 0T

Naouai, M., 1F

Nguyen, MaĂŻ K., 0Y

Normand, N., 0I

Nurit, M., 13

Nuzillard, Danielle, 07, 0S, 1H

Orteu, Jean-José, 0U

Pairel, E., 17

Perrin, Guillaume, 04

Picart, Pascal, 02

Pillet, M., 17

Pinoli, Jean-Charles, 0R

Pitard, Gilles, 0A

Pommiès, Matthieu, 0C

Pracht, Monika, 0D

Quéau, Yvain, 0Z

Rebert, Martin, 0W

Rezaei, Alireza, 10

Richard, Noël, 11, 1F

Rziza, Mohammed, 0K

Saito, Takaho, 0T

Sato, Junya, 0O

Scharinger, Josef, 1G

Sharara, El Sayed A., 19

Shimada, A., 0J

Simon, B., 0F

Sireyjol, R., 0J

Smolarz, A., 0G

Stahl, J., 0P

Stolz, C., 15

Strubel, David, 0M

Suga, Nobuhiro, 1A

Sumi, Kazuhiko, 06, 1A

Sun, Sun-Gu, 1D

Swiderski, Waldemar, 0D

Takemura, Noriko, 0B

Taniguchi, R., 0J

Tarpau, CĂ©cilia, 0Y

Terada, K., 19

Tout, Karim, 0N

Traxler, Gerhard, 0E

Tsuji, A., 19

Umeda, Kazunori, 0X, 14

Urban, Jean-Philippe, 0N

Valette, Stéphane, 0R

Varriot, Valentin, 0C

Veith, Jannic, 08

Verrier, N., 0F

Viard-Gaudin, C., 0I

Viquerat, Benjamin, 0C

Vrabie, Valeriu, 07, 0S, 1H

Yagi, Yasushi, 0B

Yamashita, Atsushi, 0X

Yan, Shixun, 14

Yan, Yaping, 12

Zakeri, Faezeh Sadat, 1C

Zambal, Sebastian, 1G

Zanzouri Kechiche, A., 15

Zendagui, Abir, 0A, 13

Conference Committee

Conference Chairs

  • Christophe Cudel, UniversitĂ© de Haute Alsace (France)

  • Oliver Aubreton, UniversitĂ© de Bourgogne (France)

  • Minori Nogushi, Hitachi High-Tech (Japan)

Program Chairs

  • Kunihito Kato, Gifu University (Japan)

  • Philippe Bolon, UniversitĂ© Savoie-Mont-Blanc (France)

  • Fabrice MĂ©riaudeau, UniversitĂ© de Bourgogne (France)

Program Committee

  • Yoshimitsu Aoki, Keio University (Japan)

  • Laurent Autrique, UniversitĂ© d’Angers (France)

  • John Barron, University of Western Ontario (Canada)

  • StĂ©phane Bazeille, UniversitĂ© de Haute-Alsace (France)

  • Bruno Collichio, UniversitĂ© de Haute-Alsace (France)

  • Jean-Baptiste Courbot, UniversitĂ© de Haute-Alsace (France)

  • Matthieu Debailleul, UniversitĂ© de Haute-Alsace (France)

  • Johan Debayle, Ecole Nationale SupĂ©rieure des Mines de Saint-Etienne (France)

  • Christophe Doignon, UniversitĂ© de Strasbourg (France)

  • JĂ©rĂ´me Dubois, UniversitĂ© de Bourgogne (France)

  • Manuel Flury, UniversitĂ© de Strasbourg (France)

  • David Fofi, UniversitĂ© de Bourgogne (France)

  • Sanjoy Ghose, University of Wisconsin-Milwaukee (United States)

  • Luca Giancardo, University of Texas (United States)

  • Igor Gurov, Saint-Petersburg Institute of Fine Mechanics and Optics (Russian Federation)

  • Olivier HaeberlĂ©, UniversitĂ© de Haute-Alsace (France)

  • Ernest Hirsch, UniversitĂ© de Strasbourg (France)

  • Sophie Kohler, UniversitĂ© de Haute-Alsace (France)

  • Takashi Komuro, Saitama University (Japan)

  • Olivier Laligant, UniversitĂ© de Bourgogne (France)

  • Pierre-Jean Lapray, UniversitĂ© de Haute-Alsace (France)

  • Denis Laurendeau, UniversitĂ© de Laval (Canada)

  • Franck Marzani, UniversitĂ© de Bourgogne (France)

  • Kurt Niel, University of Applied Science Upper Austria (Austria)

  • Vicent Paquit, Oak Ridge National Laboratory (United States)

  • Jean-Charles Pinoli, UniversitĂ© de Saint-Etienne (France)

  • Yvain QuĂ©au, CNRS UMR6072 - GREYC (France)

  • Sergio Rodriguez-Florez, UniversitĂ© de Paris-Sud Orsay (France)

  • Christophe Stolz, UniversitĂ© de Bourgogne (France)

  • Abidin Syed, Universiti Teknologi Petronas (Malaysia)

  • Hironori Takimoto Okayama Prefectural University (Japan)

  • Tong Boon Tang, Universiti Teknologi Petronas (Malaysia)

  • Tankut Acarman, Galatasaray University (Turkey)

  • CĂ©line Teulière, CEA LIST (France)

  • Alain TrĂ©meau, UniversitĂ© de Saint-Etienne (France)

  • Nicolas Verrier, UniversitĂ© de Haute-Alsace (France)

  • Jonathan Weber, UniversitĂ© de Haute-Alsace (France)

Local Arrangement Committee

  • StĂ©phane Bazeille, UniversitĂ© de Haute-Alsace (France)

  • Bruno Collichio, UniversitĂ© de Haute-Alsace (France)

  • Jean-Baptiste Courbot, UniversitĂ© de Haute-Alsace (France)

  • Matthieu Debailleul, UniversitĂ© de Haute-Alsace (France)

  • Alban Foulonneau, UniversitĂ© de Haute-Alsace (France)

  • Yilbert Gimenez Henriquez, UniversitĂ© de Haute-Alsace (France)

  • Sophie Kohler, UniversitĂ© de Haute-Alsace (France)

  • Pierre-Jean Lapray, UniversitĂ© de Haute-Alsace (France)

  • Jean-Philippe Lauffenberger, UniversitĂ© de Haute-Alsace (France)

  • Thomas Laurain, UniversitĂ© de Haute-Alsace (France)

  • Yvan Maillot, UniversitĂ© de Haute-Alsace (France)

  • Benjamin Mourllion, UniversitĂ© de Haute-Alsace (France)

  • Jean-Philippe Urban, UniversitĂ© de Haute-Alsace (France)

  • Nicolas Verrier, UniversitĂ© de Haute-Alsace (France)

Session Chairs

  • 1 Image Analysis 1

    Olivier Aubreton, Université de Bourgogne (France)

  • 2 Surface Characterization

    Yvain Quéau, CNRS UMR6072 - GREYC (France)

  • 3 Non-Conventional Imaging

    Olivier Haeberlé, Université de Haute-Alsace (France)

  • 4 Deep Learning 1

    Fabrice Mériaudeau, Université de Bourgogne (France)

  • 5 Poster Session

    Jean-José Orteu, Ecole des Mines d’Albi (France)

  • 6 Deep Learning 2

    Stéphane Bazeille, Université de Haute-Alsace (France)

  • 7 Image Analysis 2

    Rin-Ichiro Taniguchi, Kyushu University (Japan)

  • 8 3D & SLAM

    Kazunori Umeda, Chuo University (Japan)

  • 9 Surface Analysis

    Danielle Nuzillard, Université de Reims (France)

  • 10 Polarimetric Imaging

    Nicolas Verrier, Université de Haute-Alsace (France)

  • 11 Multi-view & Tracking

    Pierre-Jean Lapray, Université de Haute-Alsace (France)

Introduction

Researchers from Université Haute Alsace and the IRIMAS Research Institute were proud to host the Fourteenth International Conference on Quality Control by Artificial Vision (QCAV 2019) in Mulhouse, France, 15–17 May. This international conference was first organized in France in 1993 and has occurred biannually since then with host sites worldwide including: Le Creusot, France in 1995, 1997, 2001, 2007, and 2015; Japan in 1998, 2005, 2013, and 2017; Canada in 1999; the United States in 2003; Austria 2009, and Saint Étienne, France in 2011.

Quality Control by Artificial Vision continues to undergo rapid evolution thanks to recent progress in the fields of artificial intelligence, 2D and 3D vision sensors, image processing, and non-conventional optics. This year, the main topics were 2D and 3D machine vision, machine learning, and artificial intelligence (AI). The conference was also honored with the presence of two renowned guest speakers: Prof. Pascal Picart, Université du Mans (France) and Dr. Yvo Ihrke, Carl Zeiss GmbH (Germany), who delivered talks exploring non-conventional imaging systems and light field imaging.

For the fourteenth QCAV conference proceedings, fifty papers were selected by the International Committee from among seventy-eight submissions (five of which were presented in the conference’s poster session). The authors were from Austria, Australia, Qatar, France, Japan, Pakistan, United Kingdom, Spain, Columbia, Germany, Greece, India, Luxembourg, Morocco, Peru, Belgium, Sri Lanka, Saudi Arabia, Mexico, and Italy.

It is also our pleasure to announce a special issue of the Journal of Electronic Imaging published by SPIE, with guest editors Prof. Olivier Aubreton, Université de Bourgogne (France), Prof. Kunihito Kato, Gifu University (Japan), and Prof. Christophe Cudel, Université Haute-Alsace (France), dedicated to QCAV and featuring selections based on the best papers presented at the conference, among other submissions.

We also would like to thank our partners and sponsors for their support: La Faculté des Sciences de Mulhouse (France); Mulhouse Alsace Agglomération (France); and La Region Grand-Est; IDS GmbH (Germany).

Christophe Cudel

Stéphane Bazeille

Nicolas Verrier

© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 11172", Proc. SPIE 11172, Fourteenth International Conference on Quality Control by Artificial Vision, 1117201 (16 July 2019); https://doi.org/10.1117/12.2540539
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KEYWORDS
Imaging systems

Image quality

3D image processing

Image segmentation

Image analysis

Control systems

Machine vision

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