Presentation + Paper
20 November 2019 Third harmonic (TH) generation: a tool to study dielectric material properties near the laser induced damage threshold (LIDT)
Author Affiliations +
Proceedings Volume 11173, Laser-induced Damage in Optical Materials 2019; 111731L (2019) https://doi.org/10.1117/12.2536440
Event: SPIE Laser Damage, 2019, Broomfield (Boulder area), Colorado, United States
Abstract
Third harmonic generation (THG) in dielectric films with femtosecond laser pulses is used to study properties of dielectric thin films and stacks thereof below and above the 1-on-1 laser damage threshold. Deviations from the ideal cubic relationship between third-harmonic signal and incident fundamental fluence are a result of several fundamental processes. Their relative contributions are assessed by comparing results from LIDT and conversion efficiency measurements as well as beam profile and pump-probe studies.
Conference Presentation
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Amir Khabbazi Oskouei, Luke Emmert, Morten Steinecke, Marco Jupé, Detlev Ristau, Lars Jensen, and Wolfgang Rudolph "Third harmonic (TH) generation: a tool to study dielectric material properties near the laser induced damage threshold (LIDT)", Proc. SPIE 11173, Laser-induced Damage in Optical Materials 2019, 111731L (20 November 2019); https://doi.org/10.1117/12.2536440
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KEYWORDS
Dielectrics

Absorption

Laser damage threshold

Refractive index

Plasma

Electrons

Laser induced damage

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