Characterization of micro-pixelated InGaP/AlGaInP quantum well structures

Younes Boussadi; Névine Rochat; Jean-Paul Barnes; Badhise Ben Bakir; Philippe Ferrandis; Bruno Masenelli; Christophe Licitra

doi:10.1117/12.2544350

25 February 2020 Characterization of micro-pixelated InGaP/AlGaInP quantum well structures

Younes Boussadi, Névine Rochat, Jean-Paul Barnes, Badhise Ben Bakir, Philippe Ferrandis, Bruno Masenelli, Christophe Licitra

Author Affiliations +

Proceedings Volume 11302, Light-Emitting Devices, Materials, and Applications XXIV; 1130221 (2020) https://doi.org/10.1117/12.2544350
Event: SPIE OPTO, 2020, San Francisco, California, United States

Abstract

In this paper, we present a structural and optical study on micro-pixelated InGaP/AlGaInP quantum well structures with different pixel sizes down to 6 μm and a red emission at 636 nm. Temperature-dependent photoluminescence and cathodoluminescence cartographies were coupled to observe the emission homogeneity at the pixel scale and to study the impact of non-radiative recombination from sidewall defects. We deduced that micro-LEDs are impacted by surface recombination and we estimated the thermal quenching of photoluminescence related to defects. At low temperatures, a stronger luminescence was also observed from the pixel edges due to the diffusion coefficient or a geometric effect. Finally, the study was completed by a TOF-SIMS analysis in order to provide information about material composition homogeneity.

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Younes Boussadi, Névine Rochat, Jean-Paul Barnes, Badhise Ben Bakir, Philippe Ferrandis, Bruno Masenelli, and Christophe Licitra "Characterization of micro-pixelated InGaP/AlGaInP quantum well structures", Proc. SPIE 11302, Light-Emitting Devices, Materials, and Applications XXIV, 1130221 (25 February 2020); https://doi.org/10.1117/12.2544350

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