Paper
13 November 2019 Study on improvement of the accuracy of scanning electron microscope: energy dispersed spectroscopy quantitative analysis
Cong Cao, Jian Zhang, Mengmeng Dou, Dongsheng Zhao
Author Affiliations +
Proceedings Volume 11343, Ninth International Symposium on Precision Mechanical Measurements; 1134304 (2019) https://doi.org/10.1117/12.2541537
Event: International Symposium on Precision Mechanical Measurements 2019, 2019, Chongqing, China
Abstract
With the development of science and technology, scanning electron microscope - energy dispersed spectroscopy (SEM-EDS) with its advantages of convenience, easy operation and high reliability become the most widely used instrument in micro-beam analysis field. EDS sometimes is considered as a semi-quantitative or even qualitative instrument compared with WDS and other chemical methods in element type and composition analysis. However, SEM-EDS can provide accurate results if parameters are set properly. This paper discusses how to improve the accuracy of EDS quantitative analysis by changing SEM and EDS working conditions.
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Cong Cao, Jian Zhang, Mengmeng Dou, and Dongsheng Zhao "Study on improvement of the accuracy of scanning electron microscope: energy dispersed spectroscopy quantitative analysis", Proc. SPIE 11343, Ninth International Symposium on Precision Mechanical Measurements, 1134304 (13 November 2019); https://doi.org/10.1117/12.2541537
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
Back to Top