Presentation + Paper
1 April 2020 Riesz transform-based digital four-step phase-shifting interferometer
Author Affiliations +
Abstract
Phase-shifting interferometry is a highly accurate technique for obtaining phase distribution from the recorded fringe patterns. Generally, phase-shifting interferometry requires recording several fringe patterns with varying phase shifts experimentally and during the acquisition, the object must be stable. Also, the atmospheric turbulence and mechanical conditions should also remain constant during this time. These requirements limit the use of these phase-shifting interferometric techniques in dynamic event studies. In the present work, we introduce Riesz transformed based digital four-step phase-shifting interferometer to obtain phase distribution from a single recorded fringe pattern. All the experimental phase-shifting setups necessary to realize the phase-shifting are removed. The idea is based on the recording of a single fringe pattern, and computes its Riesz transform at first, second and third-orders. The obtained Riesz transform components are combined to generate three π/2 phase-shifted fringe patterns, and then, the phase distribution is obtained from these phase-shifted fringe patterns. The performance of this method is demonstrated first by using numerical simulation and the quantitative appraisal is given by using image quality index. Further, we apply this technique on a real fringe pattern recorded in digital speckle pattern interferometry (DSPI). The obtained results reveal that our method provides a simple and accurate solution for phase evaluation, therefore, makes it suitable for real-time measurements.
Conference Presentation
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yassine Tounsi, Manoj Kumar, Ahmed Siari, Fernando Mendoza-Santoyo, Osamu Matoba, and Abdelkrim Nassim "Riesz transform-based digital four-step phase-shifting interferometer", Proc. SPIE 11353, Optics, Photonics and Digital Technologies for Imaging Applications VI, 113530R (1 April 2020); https://doi.org/10.1117/12.2555356
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KEYWORDS
Fringe analysis

Phase shifts

Speckle

Phase interferometry

Interferometry

Interferometers

Image quality

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