Modeling, synthesis, and nano-positioning of semiconductor point defects (Conference Presentation)

Luke J. Bissell; Michael S. Wolf; Nicholas W. Gothard; Michael A. Slocum; Piyush J. Shah; Md S. Alam; Chenglong Zhao

doi:10.1117/12.2558782

27 April 2020 Modeling, synthesis, and nano-positioning of semiconductor point defects (Conference Presentation)

Luke J. Bissell, Michael S. Wolf, Nicholas W. Gothard, Michael A. Slocum, Piyush J. Shah, Md S. Alam, Chenglong Zhao

Proceedings Volume 11389, Micro- and Nanotechnology Sensors, Systems, and Applications XII; 1138919 (2020) https://doi.org/10.1117/12.2558782
Event: SPIE Defense + Commercial Sensing, 2020, Online Only

Abstract

Point defects in semiconductors are useful as quantum sensors, quantum emitters, and qubits for quantum computation. We have used ab initio quantum chemistry (supercell) calculations to model the photoluminescence of a new vanadium-nitrogen defect in diamond. Using ion implantation, we have attempted to synthesize this defect, and I will present spectroscopic analysis of our sample. Nanoscale positioning of defects is desired to improve the reliable coupling of defect centers to quantum photonic devices. I will discuss the merits of several methods for achieving this: introduction of functionalized seed molecules during diamond synthesis, laser annealing, and ion implantation. I will also present a scalable opto-thermal-mechanical printing method for additively releasing nanoparticles from a donor substrate and transferring them to a target substrate, such as a photonic device. Such integration is a crucial step towards realizing commercially scalable quantum sensing devices.

Conference Presentation

Citation Download Citation

Luke J. Bissell, Michael S. Wolf, Nicholas W. Gothard, Michael A. Slocum, Piyush J. Shah, Md S. Alam, and Chenglong Zhao "Modeling, synthesis, and nano-positioning of semiconductor point defects (Conference Presentation)", Proc. SPIE 11389, Micro- and Nanotechnology Sensors, Systems, and Applications XII, 1138919 (27 April 2020); https://doi.org/10.1117/12.2558782

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