Paper
31 January 2020 Optimal measurements strategy in micro-tomography: amount of data and representative elementary volume assessment and application to porous media
A. Khafizov, M. Grigoriev, A. Ingacheva, D. Bogdanov, V. Asadchikov
Author Affiliations +
Proceedings Volume 11433, Twelfth International Conference on Machine Vision (ICMV 2019); 114332Y (2020) https://doi.org/10.1117/12.2556293
Event: Twelfth International Conference on Machine Vision, 2019, Amsterdam, Netherlands
Abstract
Nowadays, microtomography experiments require a lot of time to collect data and process it. In order to observe realtime processes (e.g. fluid flow through porous media), measurements and calculations should be carried out fast enough, therefore optimization task should be solved. Two approaches were developed to solve it. The first one is associated with the search of optimal experimental parameters: number of projection and the quality of the detector. The second one is involved with representative elementary volume determination. Moreover, this determination technique is described in general terms and can be applied not only for porous media studies. Both algorithms are based on comparison methods of pore sizes distribution histograms. On this purposes, apart from common Earth Mover’s Distance (Wasserstein Distance) metric, a new Mean Vector Distance (MVD) metric was designed and described in this paper.
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. Khafizov, M. Grigoriev, A. Ingacheva, D. Bogdanov, and V. Asadchikov "Optimal measurements strategy in micro-tomography: amount of data and representative elementary volume assessment and application to porous media", Proc. SPIE 11433, Twelfth International Conference on Machine Vision (ICMV 2019), 114332Y (31 January 2020); https://doi.org/10.1117/12.2556293
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Data processing

X-rays

Image quality

Detection and tracking algorithms

Optimization (mathematics)

Statistical methods

Back to Top