Presentation + Paper
20 August 2020 Error sources, compensation, and probe path optimization for on-machine metrology of freeform optics
Author Affiliations +
Abstract
As on-machine metrology for freeform optics becomes increasingly popular, error analysis and compensation techniques and probe path optimization must evolve in response. For this work, a four axis Moore Nanotech Universal Measuring Machine (based on a diamond turning machine design) is used with a Precitec chromatic confocal probe. The system is set up in a thermally controlled enclosure, and a LabVIEW data acquisition program is used to record probe data, time, and machine positioning data directly from the machine scales. Issues addressed include probe testing and calibration, thermal errors, data age, compensation methods, and probe path optimization for error reduction. The combined error reduction/compensation approach improves on-machine metrology for freeform optics.
Conference Presentation
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Laura Hopper, Todd Noste, Jimmie Miller, and Chris Evans "Error sources, compensation, and probe path optimization for on-machine metrology of freeform optics", Proc. SPIE 11487, Optical Manufacturing and Testing XIII, 1148709 (20 August 2020); https://doi.org/10.1117/12.2568797
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CITATIONS
Cited by 1 scholarly publication.
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KEYWORDS
Metrology

Data acquisition

Time metrology

Sensors

Mathematical modeling

Motion measurement

Body temperature

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