Aberration-induced errors in deflectometric measurement

Xiangchao Zhang; Zhenqi Niu; Junqiang Ye; Shaoliang Li; Wanliang Zhao

doi:10.1117/12.2565588

20 August 2020 Aberration-induced errors in deflectometric measurement

Xiangchao Zhang, Zhenqi Niu, Junqiang Ye, Shaoliang Li, Wanliang Zhao

Proceedings Volume 11487, Optical Manufacturing and Testing XIII; 114870K (2020) https://doi.org/10.1117/12.2565588
Event: SPIE Optical Engineering + Applications, 2020, Online Only

Abstract

Deflectometry is a powerful measuring technique of complex optical surfaces. Usually a series of binary patterns or sinusoidal fringes are displayed on a screen, and correspondences are established between the screen and camera points according to their gray levels or phases. The image associated with a screen pixel is blurred due to the defocus and aberrations of the off-axis imaging system, and the calculated location of the correspondence point will in turn be biased. The space variant point spread function associated with the catadioptric system is analyzed based on the light field method, and the resulting blurring effect is then addressed using Wiener deconvolution algorithm. Henceforth the phase errors in the captured images can be compensated effectively. Experimental results are presented to demonstrate the feasibility and effectiveness of the proposed method.

Conference Presentation

Citation Download Citation

Xiangchao Zhang, Zhenqi Niu, Junqiang Ye, Shaoliang Li, and Wanliang Zhao "Aberration-induced errors in deflectometric measurement", Proc. SPIE 11487, Optical Manufacturing and Testing XIII, 114870K (20 August 2020); https://doi.org/10.1117/12.2565588

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