Paper
7 October 2020 Pixel-super-resolution lensfree microscopy based on multiple-wavelength scanning
Author Affiliations +
Proceedings Volume 11571, Optics Frontier Online 2020: Optics Imaging and Display; 1157114 (2020) https://doi.org/10.1117/12.2580523
Event: Optics Frontiers Online 2020: Optics Imaging and Display (OFO-1), 2020, Shanghai, China
Abstract
We present a wavelength-scanning-based lensfree microscopy that generates high-resolution reconstructions from undersampled raw measurements captured at multiple wavelengths.The reconstruction result of the standard 1951 USAF achieves a half-pitch lateral resolution of 775 nm, corresponding to a numerical aperture of ∼ 1.0, across a large field of view (∼ 29.85 mm2). Compared with other super-resolution methods such as lateral or axial shift-based device and illumination source rotation design, wavelength scanning avoids the need for shifting/rotating mechanical components. This wavelength-scanning super-resolution method would benefit the research and development of more stable lensfree microscopy system.
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Xuejuan Wu, Jialin Zhang, Jiasong Sun, Linpeng Lu, Qian Chen, and Chao Zuo "Pixel-super-resolution lensfree microscopy based on multiple-wavelength scanning", Proc. SPIE 11571, Optics Frontier Online 2020: Optics Imaging and Display, 1157114 (7 October 2020); https://doi.org/10.1117/12.2580523
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KEYWORDS
Microscopy

Super resolution

Image resolution

Reconstruction algorithms

Sensors

Image retrieval

Image sensors

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