Presentation
5 March 2021 High dynamic range, sub-diffuse reflectance imaging over a wide field using an active line scan
Author Affiliations +
Abstract
Active line scan imaging (LSI) with spatial gating is explored for wide-field, sub-diffuse sensing of scattering microtextures. Spatial gating involves masking detector pixels far from the laser line of incidence on a turbid target. The active line scan provides broadband spatial frequency modulation, and the spatial gating effectively high pass filters the reflectance. The major benefits of LSI are that of high dynamic range signal preservation and high contrast-to-noise when imaging at high spatial frequencies. As such, LSI presents as an inherently high sensitivity and high dynamic range way to image microscopic scattering features on the surfaces of turbid media.
Conference Presentation
© (2021) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Samuel S. Streeter, Benjamin W. Maloney, Keith D. Paulsen, and Brian W. Pogue "High dynamic range, sub-diffuse reflectance imaging over a wide field using an active line scan", Proc. SPIE 11622, Multiscale Imaging and Spectroscopy II, 116220P (5 March 2021); https://doi.org/10.1117/12.2577717
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KEYWORDS
High dynamic range imaging

Reflectivity

Range imaging

Scattering

Laser scattering

Target detection

Modulation

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