Time-resolved photoluminescence and xenon differential transmission measurement device based on electro-optic deflector

Patrik Ščajev

doi:10.1117/12.2576185

5 March 2021 Time-resolved photoluminescence and xenon differential transmission measurement device based on electro-optic deflector

Patrik Ščajev

Author Affiliations +

Proceedings Volume 11682, Optical Components and Materials XVIII; 1168205 (2021) https://doi.org/10.1117/12.2576185
Event: SPIE OPTO, 2021, Online Only

Abstract

Carrier lifetime characterization in solar cell and light emitting diode materials by time-resolved photoluminescence and differential transmission is of high importance, indicating cost-efficient streak camera suitable for such tests would be highly demanded. In this work an electro-optic deflecting device is extended to full functionality streak camera operating in wide spectral range (200-2000 nm) by using electro-optic DKDP crystals. Setup, consisting of picosecond laser for sample excitation, electro-optic deflector and imaging spectrograph with silicon and InGaAs cameras, allows spectral and temporal imaging of recombination dynamics in semiconductor materials, with variable bandgap and composition (tested on metal-halide perovskite crystal), achieving temporal resolution up to 50 ps. For the case of time-resolved differential transmission, broadband <50 ps pulsed or CW xenon light source can be used for absorption change probing.

Conference Presentation

Citation Download Citation

Patrik Ščajev "Time-resolved photoluminescence and xenon differential transmission measurement device based on electro-optic deflector", Proc. SPIE 11682, Optical Components and Materials XVIII, 1168205 (5 March 2021); https://doi.org/10.1117/12.2576185

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