Poster + Presentation + Paper
5 March 2021 Study of photoluminescent properties and light reflectance of silica and titania nanospheres in bilayer arrays
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Conference Poster
Abstract
Photoluminescence and light reflectance properties of silica and titania nanoparticles (NPs) in two bilayer configurations were studied. In the first configuration, Titania and Silica NPs monolayers were deposited on a silicon wafer, the Titania NPs monolayer was the one in contact with the wafer and silica NPs was the top monolayer. The second configuration consisted in Silica NPs bilayer. The periodic monolayers were deposited by the spin coating technique. The concentration of colloidal suspension of NPs and their distribution over the surface were controlled by the revolutions per minute (rpm) during spin coating deposition. A set of samples were annealed with increments of 10 minutes, ranging from 0 min (i.e. not annealed) to 60 min. As well other samples were annealed during 2 and 3 hours, at 1,100 °C. The bilayers were characterized using several techniques as Fourier Transform Infrared Spectroscopy (FTIR), Atomic Force Microscopy (AFM), Scanning Electron Microscopy (SEM), reflectance and photoluminescence (PL) measurements. For the first configuration, our results shown that for short annealing time the PL emission increased 6 times with respect to the non annealed sample. However, the light reflected by the first configuration is lower than the one reflected by the second configuration. These results can be attractive for light emitting devices as well as for absorbing layers on crystalline silicon solar cells.
Conference Presentation
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Carina Gutierrez, Mario Moreno, Ponciano Rodriguez, Leticia Tecuapetla, and Adrian Itzmoyotl "Study of photoluminescent properties and light reflectance of silica and titania nanospheres in bilayer arrays", Proc. SPIE 11706, Light-Emitting Devices, Materials, and Applications XXV, 117061O (5 March 2021); https://doi.org/10.1117/12.2576741
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KEYWORDS
Reflectivity

Silica

Nanoparticles

Crystals

FT-IR spectroscopy

Luminescence

Scanning electron microscopy

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