PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
This study describes inverse spectral analysis of diffuse reflectance for surface-distributed material particles on substrates. In particular, an algorithm for extraction of target spectral features for surface-distributed materials of specified dielectric response. This algorithm is based on diffuse-reflectance theory and linear combinations of basis functions representing response characteristics of different types of scattering processes. The basis functions are constructed using absorbance functions and analytical models of Mie-type scattering. Prototype inverse spectral analysis of diffuse reflectance for surface-distributed explosive particles on substrates are described, which demonstrate characteristics of the algorithm.
S. G. Lambrakos,R. Furstenberg,C. Breshike,C. Kendziora,T. Huffman,R. A. McGill, andA. Shabaev
"Inverse analysis of diffuse reflectance for surface-distributed particles using absorbance basis functions", Proc. SPIE 11749, Chemical, Biological, Radiological, Nuclear, and Explosives (CBRNE) Sensing XXII, 117490W (12 April 2021); https://doi.org/10.1117/12.2585105
ACCESS THE FULL ARTICLE
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
The alert did not successfully save. Please try again later.
S. G. Lambrakos, R. Furstenberg, C. Breshike, C. Kendziora, T. Huffman, R. A. McGill, A. Shabaev, "Inverse analysis of diffuse reflectance for surface-distributed particles using absorbance basis functions," Proc. SPIE 11749, Chemical, Biological, Radiological, Nuclear, and Explosives (CBRNE) Sensing XXII, 117490W (12 April 2021); https://doi.org/10.1117/12.2585105