In order to meet the demand of high performance development of remote sensing camera, the design of camera software is becoming more and more complex. In this way, the large-scale processing devices, such as SRAM-FPGA demand is increasing. However, due to the complex space radiation environment faced by remote sensing cameras, especially the Single-Event Upset (SEU) effect, it has a great impact on SRAM devices, which may easily lead to abnormal system operation or functional interruption. In this paper, several commonly used strategies to deal with the SEU of SRAM-FPGA were studied, and their advantages and disadvantages were compared and analyzed respectively. Based on the characteristics of remote sensing camera mission, a comprehensive strategy of SEU-tolerant was proposed, and the implementation methods and the flow chart were given. Finally, this paper used the common fault injection method to verify the correctness and effectiveness of the strategy. It was proved that this strategy could well meet the mission needs of remote sensing cameras and provide a new way to upgrade the functions of remote sensing cameras in the future.
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