Paper
5 January 1990 Optical Waveguiding In An Epitaxial Layer Of Silicon-Germanium Grown On Silicon
Richard A. Soref, Fereydoon Namavar, Joseph P. Lorenzo
Author Affiliations +
Abstract
Low-loss waveguiding at X = 1.3 µm has been observed in a partially strained, 10-µm thick, single-crystal layer of Ge0,1Si0.9 grown by chemical vapor deposition on a high-resistivity (100) silicon substrate. The TM-mode propagation loss in the multimode planar guide was less than 1.9 dB/cm. Device applications of GeSi waveguides are discussed.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Richard A. Soref, Fereydoon Namavar, and Joseph P. Lorenzo "Optical Waveguiding In An Epitaxial Layer Of Silicon-Germanium Grown On Silicon", Proc. SPIE 1177, Integrated Optics and Optoelectronics, (5 January 1990); https://doi.org/10.1117/12.963332
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Cited by 7 scholarly publications.
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KEYWORDS
Silicon

Waveguides

Germanium

Semiconducting wafers

Refractive index

Chemical vapor deposition

Integrated optics

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