Open Access Presentation
24 June 2021 Optical sociology: how organizational culture impacts advances in optical metrology
Author Affiliations +
Abstract
Optical instruments have long played a role in manufacturing, and strong arguments favor accelerated adoption of fast, non-contact measurements of surfaces, shapes and positions as an enabler for industry 4.0. High-precision techniques such as optical interferometry have advanced considerably and have found applications ranging from semiconductor wafer lithography to automotive engine production. Even though there are clear benefits, there are obstacles to the more widespread adoption of optical techniques for dimensional measurements. Many of these obstacles are technical--such as vibration sensitivity and metrological traceability; but others reflect the cultural gaps between academia, makers of optical instruments, standards organizations and end users. In this talk, I propose that understanding these cultural differences can assist in advancing optical methods for the most critical needs of data-driven manufacturing.
Conference Presentation
© (2021) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Peter J. de Groot "Optical sociology: how organizational culture impacts advances in optical metrology", Proc. SPIE 11782, Optical Measurement Systems for Industrial Inspection XII, 1178204 (24 June 2021); https://doi.org/10.1117/12.2596985
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