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1 August 2021 Tip-enhanced Raman spectroscopy for as-fabricated nanoscale characterization
Maria Vanessa B. Oguchi, Norihiko Hayazawa, Takuo Tanaka
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Proceedings Volume 11797, Plasmonics: Design, Materials, Fabrication, Characterization, and Applications XIX; 117970I (2021) https://doi.org/10.1117/12.2594361
Event: SPIE Nanoscience + Engineering, 2021, San Diego, California, United States
Abstract
Tip-enhanced Raman spectroscopy (TERS) done in ambient conditions opens the door to characterize the as-fabricated properties of nanodevices in their operating environment with both high spatial resolution and high chemical sensitivity. With sub-nanometer resolution now achievable using our TERS system in ambient, we can image nanoscale strain variations in graphene and study the strain distribution in such local domains. The effects of high photon confinement are also investigated, whose immediate manifestation is the plasmonic activation of certain Raman modes. This leads to the question of how to analyze strain at the near-field, which is quite relevant today as technology continuous to grow ever smaller.
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Maria Vanessa B. Oguchi, Norihiko Hayazawa, and Takuo Tanaka "Tip-enhanced Raman spectroscopy for as-fabricated nanoscale characterization", Proc. SPIE 11797, Plasmonics: Design, Materials, Fabrication, Characterization, and Applications XIX, 117970I (1 August 2021); https://doi.org/10.1117/12.2594361
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KEYWORDS
Raman spectroscopy
Graphene
Diffraction
Scanning tunneling microscopy
Spatial resolution
Plasmonics
Pollution control
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