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1 August 2021 Reconstruction with nonrigid alignment in tomography and 3D ptychography
Viktor Nikitin, Vincent De Andrade, Doga Gursoy, Francesco De Carlo
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Proceedings Volume 11839, X-Ray Nanoimaging: Instruments and Methods V; 118390H (2021) https://doi.org/10.1117/12.2594889
Event: SPIE Optical Engineering + Applications, 2021, San Diego, California, United States
Abstract
As X-ray imaging is pushed further into the nanoscale, the sample deformations due to the increased radiation levels or mechanical instabilities of the microscopes become more apparent, leading to challenges in realizing high-resolution microscopy under these conditions. Here we propose a distributed optimization solver for imaging of samples at the nanoscale. Our approach solves the tomography and ptychography problems jointly with projection data alignment, nonrigid sample deformation correction, and regularization. Applicability of the method is demonstrated on experimental data sets from the Transmission X-ray Microscope, and the hard X-ray nanoprobe.
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Viktor Nikitin, Vincent De Andrade, Doga Gursoy, and Francesco De Carlo "Reconstruction with nonrigid alignment in tomography and 3D ptychography", Proc. SPIE 11839, X-Ray Nanoimaging: Instruments and Methods V, 118390H (1 August 2021); https://doi.org/10.1117/12.2594889
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KEYWORDS
Tomography
Image resolution
Microscopes
Spatial resolution
Nanoprobes
Optical flow
Statistical analysis
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