Poster + Presentation + Paper
11 July 2021 Correlation plenoptic microscopy
Author Affiliations +
Conference Poster
Abstract
We present a new technique for performing three-dimensional optical microscopy based on correlation plenoptic imaging. This approach, named Correlation Plenoptic Microscopy (CPM), exploits correlations between intensity fluctuations of pseudo-thermal light to retrieve plenoptic information about the sample, i. e. both spatial information about the intensity distribution of light and angular information about the propagation direction of the light rays. This leads to an enhancement of the depth of field, overcoming the sacrifice of lateral resolution required in conventional plenoptic microscopy. The intrinsic capability to refocus out-of-focus planes of the sample enables scanning-free three-dimensional reconstruction with the resolution kept at the diffraction limit. We show a setup to perform CPM with a microscope objective and present calculations of the correlation function for this specific case. Moreover we demonstrate with simulations that CPM improves the resolution, for a given depth of field, with respect to conventional optical microscopy.
Conference Presentation
© (2021) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Davide Giannella, Gianlorenzo Massaro, Francesco Di Lena, Francesco Scattarella, Alessio Scagliola, Francesco V. V. Pepe, and Milena D'Angelo "Correlation plenoptic microscopy", Proc. SPIE 11844, Photonics for Quantum 2021, 1184419 (11 July 2021); https://doi.org/10.1117/12.2600946
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KEYWORDS
Microscopy

Optical microscopy

Visibility

3D image processing

3D scanning

Data analysis

Signal to noise ratio

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