The Use of Linear Arrays in Electronic Speckle Pattern Interferometry

Michael Short

doi:10.1117/12.969855

1 April 1990 The Use of Linear Arrays in Electronic Speckle Pattern Interferometry

Michael Short

Proceedings Volume 1194, Optics, Illumination, and Image Sensing for Machine Vision IV; (1990) https://doi.org/10.1117/12.969855
Event: 1989 Symposium on Visual Communications, Image Processing, and Intelligent Robotics Systems, 1989, Philadelphia, PA, United States

Abstract

Electronic Speckle Pattern Interferometry (ESPI) offers high resolution displacement information of objects by analysis of the relative phase between a reference beam of light and an object beam of light at two or more instants in time. The sampling of the data is usually performed with two-dimensional solid-state arrays. Use of a one-dimensional array, however, offers increased displacement resolution or larger field of view, depending upon the optical setup, and offers higher line rates over two-dimensional cameras. The disadvantages imposed by the one-dimensional vs two-dimensional sampling, including object motion restrictions and automatic fringe extraction are discussed.

Citation Download Citation

Michael Short "The Use of Linear Arrays in Electronic Speckle Pattern Interferometry", Proc. SPIE 1194, Optics, Illumination, and Image Sensing for Machine Vision IV, (1 April 1990); https://doi.org/10.1117/12.969855

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available