Presentation + Paper
4 March 2022 Laser-induced scattering structures for metrology and distributed sensing
M. Beresna, Q. Sun, P. Falak, D. Phillips, T. Vettenburg, A. Masoudi, G. Brambilla
Author Affiliations +
Abstract
Femtosecond laser irradiation allows to modify the optical properties of transparent materials with high accuracy. In many applications, optical scattering produced by the laser irradiation is one of the major limiting factors. However, there are situations when the scattering is responsible for the basic principle of operation of the optical element. This report reviews two research directions where laser-induced scattering can be successfully exploited. First, spectroscopic measurements can be performed by analyzing the speckle patterns created by the scattering medium. The measurements are made possible by the strong dependence of the speckle pattern on the wavelength of light. A scattering chip created thanks to a femtosecond laser makes allows addressing the stability problem faced by many scattering spectrometers. The volumetric scattering centers are induced in silica substrate via micro-explosions caused by the focused laser beam. Such a spectrometer can be successfully used for interrogating fiber Bragg gratings or interferometers. Second example is found in optical reflectometry. This technology allows turning an optical fiber into a distributed microphone or thermometer. A single optical fiber can monitor a stretch of several tens of kilometers with an accuracy of several meters. Such systems have wide range of applications in civil engineering, geosciences and other fields. Reflectometry measurements are performed by observing the back-scattered light produced by the glass medium of the optical fiber. Femtosecond laser writing allows effectively increase backscattered light whilst introducing minimal additional losses. In this way, the sensitivity of reflectometric systems can be increased or their range can be extended.
Conference Presentation
© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. Beresna, Q. Sun, P. Falak, D. Phillips, T. Vettenburg, A. Masoudi, and G. Brambilla "Laser-induced scattering structures for metrology and distributed sensing", Proc. SPIE 11988, Laser Applications in Microelectronic and Optoelectronic Manufacturing (LAMOM) XXVII, 1198803 (4 March 2022); https://doi.org/10.1117/12.2607775
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KEYWORDS
Scattering

Laser scattering

Light scattering

Glasses

Femtosecond phenomena

Spectrometers

Optical fibers

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