CONFERENCE PROCEEDINGS
Advanced Search
Home > Proceedings > Volume 12057 > Article
Paper
1 November 2021 High-accuracy real-time omnidirectional 3D scanning and inspection system
Jiaming Qian, Shijie Feng, Yixuan Li, Qian Chen, Chao Zuo
Author Affiliations +
Proceedings Volume 12057, Twelfth International Conference on Information Optics and Photonics; 120573N (2021) https://doi.org/10.1117/12.2606604
Event: Twelfth International Conference on Information Optics and Photonics, 2021, Xi'an, China
Abstract
Three-dimensional (3D) imaging technology has been widely applied in various fields, such as intelligent manufacturing, online inspection, reverse engineering, cultural relic protection, etc. In this work, we present a high-accuracy real-time omnidirectional 3D scanning and inspection system based on fringe projection profilometry. Firstly, a multi-camera system based on geometric constraints is constructed to perform stereo phase unfolding without additional auxiliary projection images to ensure high-accuracy 3D data acquisition in real time. Then, we propose a rapid 3D point cloud registration approach combining simultaneous localization and mapping (SLAM) with iterative closest point (ICP) techniques to achieve alignment of point cloud slices with accuracy of up to 100 microns. Finally, a cycle-positioning-based registration scheme is developed to allow for real-time 360 degree 3D surface defect inspection. The experimental results show that our system is capable of real-time omnidirectional 3D modelling and real-time 360° defect detection.
© (2021) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Citation Download Citation
Jiaming Qian, Shijie Feng, Yixuan Li, Qian Chen, and Chao Zuo "High-accuracy real-time omnidirectional 3D scanning and inspection system", Proc. SPIE 12057, Twelfth International Conference on Information Optics and Photonics, 120573N (1 November 2021); https://doi.org/10.1117/12.2606604
ACCESS THE FULL ARTICLE
ORGANIZATIONAL
Sign in with credentials provided by your organization.
INSTITUTIONAL
Select your institution to access the SPIE Digital Library.
SELECT YOUR INSTITUTION
PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
PERSONAL SIGN IN
No SPIE Account? Create one
PURCHASE THIS CONTENT
SUBSCRIBE TO DIGITAL LIBRARY
50 downloads per 1-year subscription
Members: $195
Non-members: $335 ADD TO CART
25 downloads per 1 - year subscription
Members: $145
Non-members: $250 ADD TO CART
PURCHASE SINGLE ARTICLE
Includes PDF, HTML & Video, when available
Members: $17.00
Non-members: $21.00 ADD TO CART
PROCEEDINGS
 7 PAGES
DOWNLOAD PAPER SAVE TO MY LIBRARY
GET CITATION
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
3D modeling
3D acquisition
Inspection
3D metrology
3D scanning
Defect inspection
RELATED CONTENT
Subscribe to Digital Library
Receive Erratum Email Alert
Back to Top