Paper
22 December 2021 Conversion method from fault detection rate to fault test coverage rate
Yi Deng, Junyou Shi, Zhenyang Lv
Author Affiliations +
Proceedings Volume 12058, Fifth International Conference on Traffic Engineering and Transportation System (ICTETS 2021); 120584D (2021) https://doi.org/10.1117/12.2619962
Event: 5th International Conference on Traffic Engineering and Transportation System (ICTETS 2021), 2021, Chongqing, China
Abstract
The fault detection rate is one of the common parameters in the current quantitative testability requirements, and it reflects the product's ability to detect faults. However, in the early stages of product design, there is a general lack or inaccuracy of failure rate information, which makes it impossible to accurately determine the fault detection rate index in the early design stage. To overcome these problems, a new testability quantitative requirement index named fault test coverage rate is presented. Based on the basic definitions of the above two indicators, four models of conversion model from fault detection rate to fault test coverage rate are proposed. Our case study results clearly demonstrate the excellence of the proposed method.
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Yi Deng, Junyou Shi, and Zhenyang Lv "Conversion method from fault detection rate to fault test coverage rate", Proc. SPIE 12058, Fifth International Conference on Traffic Engineering and Transportation System (ICTETS 2021), 120584D (22 December 2021); https://doi.org/10.1117/12.2619962
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KEYWORDS
Data modeling

Data conversion

Failure analysis

Process modeling

Product engineering

Instrument modeling

Reliability

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