Paper
18 March 2022 Research on defect recognition technology of distribution network based on image enhancement
Peifeng Zhao, Xiaojun Fan, Yongjing Hao, Wenna Zhang
Author Affiliations +
Proceedings Volume 12168, International Conference on Computer Graphics, Artificial Intelligence, and Data Processing (ICCAID 2021); 1216812 (2022) https://doi.org/10.1117/12.2631135
Event: International Conference on Computer Graphics, Artificial Intelligence, and Data Processing (ICCAID 2021), 2021, Harbin, China
Abstract
With the development of new generation information technology such as big data analysis, artificial intelligence and image analysis, intelligent detection and identification of distribution network line defects has become possible. At present, the identification of distribution network line defects mainly depends on the human eye observing the visible image, but the visible image is easy to be affected by uncertain factors such as jitter or defocus, resulting in identification errors. In order to make up for the shortcomings of the existing recognition technology, this paper combines the infrared image with the visible image, and designs an image enhancement method to image the defects of the distribution network line based on the "infrared + visible" dual vision system. On this basis, the infrared image features are extracted, the defect database is constructed, and the distribution network line defect recognition algorithm based on image enhancement is designed to detect and recognize the equipment defects through multi network fusion.
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Peifeng Zhao, Xiaojun Fan, Yongjing Hao, and Wenna Zhang "Research on defect recognition technology of distribution network based on image enhancement", Proc. SPIE 12168, International Conference on Computer Graphics, Artificial Intelligence, and Data Processing (ICCAID 2021), 1216812 (18 March 2022); https://doi.org/10.1117/12.2631135
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KEYWORDS
Image fusion

Infrared imaging

Infrared radiation

Image enhancement

Databases

Visible radiation

Detection and tracking algorithms

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