Terahertz data analysis for the design and characterization of thin films

Gilberto Gutiérrez-Tadeo; Rogelio Salinas-Gutiérrez; Mariana Alfaro-Gómez

doi:10.1117/12.2633054

30 September 2022 Terahertz data analysis for the design and characterization of thin films

Gilberto Gutiérrez-Tadeo, Rogelio Salinas-Gutiérrez, Mariana Alfaro-Gómez

Proceedings Volume 12230, Terahertz Emitters, Receivers, and Applications XIII; 122300L (2022) https://doi.org/10.1117/12.2633054
Event: SPIE Optical Engineering + Applications, 2022, San Diego, California, United States

Conference Poster

Abstract

Terahertz time-domain spectroscopy is a powerful tool for characterizing material properties that were experimentally inaccessible until recently. For multilayered systems, the signal presents echoes with characteristics related to the optical properties of each corresponding layer. However, if the layers are very thin, echoes in the time domain may overlap and more complex and specific methods of analysis should be used to calculate the optical properties of the samples. In this work, we implement four different reported methods for analyzing thin layered samples and we compare them to evaluate their capabilities and results.

Citation Download Citation

Gilberto Gutiérrez-Tadeo, Rogelio Salinas-Gutiérrez, and Mariana Alfaro-Gómez "Terahertz data analysis for the design and characterization of thin films", Proc. SPIE 12230, Terahertz Emitters, Receivers, and Applications XIII, 122300L (30 September 2022); https://doi.org/10.1117/12.2633054

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