Presentation + Paper
4 October 2022 Bridging the gap between electron and optical microscopy through neural network-enabled training and imaging
Author Affiliations +
Abstract
Obtaining high-resolution images using an optical microscope is critical when dealing with micro/nanoscale objects. Current techniques use high magnification objective lenses with high numerical apertures to resolve closely spaced objects at the micron/nanoscale. However, these lenses often require additional optics and have a narrow depth of field, preventing ease of use. To date, scanning electron microscopy (SEM) is used for imaging beyond the diffraction limit and has led to various breakthroughs in semiconductor physics and nanotechnology. An alternative to an SEM is using artificial intelligence (AI) to enable super-resolution techniques with correlated image sets. We utilize a convolutional neural network (CNN) and generative adversarial network (GAN) to train correlated images gathered from higher magnification SEM and lower magnification SEM, resulting in a model that enables resolving nanoscale features. We demonstrated that by training a neural network with SEM images, we are able to aid the optical microscope to image beyond the diffraction limit with a resolution closer to the SEM.
Conference Presentation
© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. Zaini, J. Perkins, H. Cheng, and B. Gholipour "Bridging the gap between electron and optical microscopy through neural network-enabled training and imaging", Proc. SPIE 12239, Unconventional Imaging and Adaptive Optics 2022, 122390K (4 October 2022); https://doi.org/10.1117/12.2633249
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KEYWORDS
Scanning electron microscopy

Optical microscopes

Diffraction

Optical microscopy

Neural networks

Super resolution

Tin

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