Poster + Presentation + Paper
2 December 2022 Sub-ps MHz green laser-induced contamination on dielectric coatings in air
Author Affiliations +
Conference Poster
Abstract
Laser-induced contamination (LIC) degrades the performance of optical components and can result in optical losses or even laser-induced damage. LIC deposit formation limits reliable operation of high repetition rate industrial lasers. In this work, we investigate LIC growth on dielectric oxide thin films in air environment irradiated by MHz sub-ps laser at 515 nm. We study the LIC growth dynamic in dependence on thin film deposition method, thin film material and thin film thickness.
Conference Presentation
© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Marek Stehlík, Janis Zideluns, Frank Wagner, Fabien Lemarchand, Camille Petite, Antonin Moreau, Aude Lereu, Marco Minissale, Julien Lumeau, and Laurent Gallais "Sub-ps MHz green laser-induced contamination on dielectric coatings in air", Proc. SPIE 12300, Laser-Induced Damage in Optical Materials 2022, 123000A (2 December 2022); https://doi.org/10.1117/12.2642516
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KEYWORDS
Contamination

Dielectrics

Niobium

Optical coatings

Optical components

Thin films

Deposition processes

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