New correlation method for measuring texture noise in x-ray screens

Reid E. Kellogg; Jacob Beutel

doi:10.1117/12.18819

1 July 1990 New correlation method for measuring texture noise in x-ray screens

Reid E. Kellogg, Jacob Beutel

Proceedings Volume 1231, Medical Imaging IV: Image Formation; (1990) https://doi.org/10.1117/12.18819
Event: Medical Imaging '90, 1990, Newport Beach, CA, United States

Abstract

A new method to measure the texture (structure) noise produced by x-ray screens has been developed. Different films are exposed with the same screen and are scanned in registration. The numerical correlation of the two sets of pixel data then contains only the texture noise component. This is a powerful technique allowing texture noise to be measured quantitatively in the presence of the quantum noise and film grain noise background. Our results support the generally accepted belief that texture noise is small compared with quantum and film grain noise. There are advantages to visualizing texture noise behavior in Cartesian space (as correlation functions) as well as in frequency space (as noise power spectra). Some examples of structure noise correlations and the corresponding spectra are presented.

Citation Download Citation

Reid E. Kellogg and Jacob Beutel "New correlation method for measuring texture noise in x-ray screens", Proc. SPIE 1231, Medical Imaging IV: Image Formation, (1 July 1990); https://doi.org/10.1117/12.18819

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