Presentation + Paper
15 March 2023 Growth of cubic InxGa1-xN over whole composition by MBE
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Abstract
Cubic InxGa1-xN alloys are a candidate material for optoelectronic applications because they lack internal polarization fields and promise to cover a vast range of emission wavelengths. However, the large discrepancy in interatomic spacing and growth temperatures of c-GaN and c-InN hinder InxGa1-xN-growth. We report cubic InxGa1-xN layers grown by plasmaassisted MBE and achieve continuous miscibility of the indium content x(In) over the whole composition range. X-ray diffraction precisely monitors the composition, phase purity and miscibility of the thin films. Furthermore, we discuss the impact of the indium content on the crystallinity. Complementary, low-temperature photoluminescence studies elucidate the optical response of cubic InxGa1-xN layers.
Conference Presentation
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. F. Zscherp, S. A. Jentsch, M. J. Müller, M. Littmann, F. Meier, D. M. Hofmann, D. J. As, S. Chatterjee, and J. Schörmann "Growth of cubic InxGa1-xN over whole composition by MBE", Proc. SPIE 12421, Gallium Nitride Materials and Devices XVIII, 124210B (15 March 2023); https://doi.org/10.1117/12.2648296
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KEYWORDS
Indium

Reflection

Alloys

Photoluminescence

Emission wavelengths

Optical properties

Signal detection

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