Presentation + Paper
15 June 2023 Inverse doping profile extraction as an enabling tool for accurate SPAD modeling
Author Affiliations +
Abstract
Physical models are key tools for developing new SPADs structures. However, as most SPADs characteristics strongly depends on the electric field, a precise knowledge of the doping profile is required. Unfortunately, common profiling techniques are not accurate enough. To cope with this problem, we developed an inverse approach which resorts to the combined use of electrical simulations and capacitance-voltage measurements. We applied the technique to multiple SPADs and we used the extracted profile to calculate their breakdown voltages. Simulated results closely matching the experimental outcomes provide us a strong validation of the proposed extraction technique.
Conference Presentation
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Andrea Bonzi, Gabriele Laita, Ivan Rech, and Angelo Gulinatti "Inverse doping profile extraction as an enabling tool for accurate SPAD modeling", Proc. SPIE 12512, Advanced Photon Counting Techniques XVII, 1251207 (15 June 2023); https://doi.org/10.1117/12.2665696
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KEYWORDS
Doping

Single photon avalanche diodes

Profiling

Simulations

Modeling

TCAD

Electric fields

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