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23 January 2023 An improved integrated coherent receiver optical-electronic testing system
Xun Lei, Jiaxin Peng, Bolan Liu, Shichao Zhu, Sheng Yu, Luluzi Lu, Quan Cao, Hao Jiang
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Proceedings Volume 12556, AOPC 2022: Optoelectronics and Nanophotonics; 125561B (2023) https://doi.org/10.1117/12.2652043
Event: Applied Optics and Photonics China 2022 (AOPC2022), 2022, Beijing, China
Abstract
We present an improved 400G chip/device level Integrated Coherent Receiver (ICR) optical-electronic testing system based on the system last year [1]. It shows high repeatability and high accuracy compared with commercial system. This new system can greatly promote the efficiency, and it is also compatible for 100G/400G chip level test and device level test. What’s more, the system can get most of important parameters of ICR automatically.
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Xun Lei, Jiaxin Peng, Bolan Liu, Shichao Zhu, Sheng Yu, Luluzi Lu, Quan Cao, and Hao Jiang "An improved integrated coherent receiver optical-electronic testing system", Proc. SPIE 12556, AOPC 2022: Optoelectronics and Nanophotonics, 125561B (23 January 2023); https://doi.org/10.1117/12.2652043
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KEYWORDS
Receivers
Silicon photonics
Integrated circuits
Wafer-level optics
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