Paper
21 March 2023 The using of x-ray grazing incidence diffraction technique in KDP surface characterization
Yan Zhang, Qi Chao Fan , Jia Wei Li , Hui Zhang , Hua Bin He , Chao Wang, Wei Gao, Fang Ji
Author Affiliations +
Proceedings Volume 12595, Advanced Fiber Laser Conference (AFL2022); 125950B (2023) https://doi.org/10.1117/12.2666983
Event: Advanced Fiber Laser Conference (AFL2022), 2022, Changsha, China
Abstract
Bulk single-crystal potassium dihydrogen phosphate (KDP) is a nonlinear optical material mainly used in Inertial Confinement Fusion (ICF) facility. Since bulk single-crystal KDP is fragile, various defects usually appear in the surface layer, for example, laser-induced, cutting-induced, polishing-induced and dissolution-induced defects. In present work, the x-ray grazing incidence diffraction technique (GIXRD) is introduced to investigate the structure of these defects. The GIXRD method is proved to be a nondestructive and effective way for bulk single-crystal KDP defect characterization. Based on this method, it is found that the cutting-induced defect is a polycrystalline KDP layer, while the polishing-induced defect is a heterostructure layer. Meanwhile, the dissolution-induced defect, after atmosphere dissolution and accelerate dissolution, is an amorphous layer and a KDP recrystallized layer, respectively. In addition, the depth of these defect layers can be evaluated by the GIXRD methods.
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yan Zhang, Qi Chao Fan , Jia Wei Li , Hui Zhang , Hua Bin He , Chao Wang, Wei Gao, and Fang Ji "The using of x-ray grazing incidence diffraction technique in KDP surface characterization", Proc. SPIE 12595, Advanced Fiber Laser Conference (AFL2022), 125950B (21 March 2023); https://doi.org/10.1117/12.2666983
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KEYWORDS
Diffraction

Surface finishing

Single point diamond turning

Heterojunctions

Polishing

Crystals

X-rays

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