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9 March 2023 Research on the development progress of insulation defects inside the gummed paper sleeve
Yajun Qiao, Tongchun Luo, Haicheng Hong, Shilong Guan, Fusheng Zhou, Ruodong Huang, Chao Gao, Yun Yang
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Proceedings Volume 12600, International Conference on Optoelectronic Materials and Devices (ICOMD 2022); 1260020 (2023) https://doi.org/10.1117/12.2674348
Event: 2022 International Conference on Optoelectronic Materials and Devices, 2022, Chongqing, China
Abstract
In order to obtain insulation characteristic parameters corresponding to casing defects, the causes of defects were analyzed, and defects were simulated in actual casing, including poor drying of insulating paper inside casing, microcracks in core caused by thermal stress concentration during core solidification, and bubbles generated in core due to poor material degassing. The characteristics of partial discharge dielectric loss factor tanδ and capacitance number during the early insulation defect development of epoxy adhesive paper casing were studied by comparative measurement. The results show that the tanδ value and capacitance value of defective casing increase with aging time. The research results can provide reference for casing factory test and on-site insulation diagnosis.
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Yajun Qiao, Tongchun Luo, Haicheng Hong, Shilong Guan, Fusheng Zhou, Ruodong Huang, Chao Gao, and Yun Yang "Research on the development progress of insulation defects inside the gummed paper sleeve", Proc. SPIE 12600, International Conference on Optoelectronic Materials and Devices (ICOMD 2022), 1260020 (9 March 2023); https://doi.org/10.1117/12.2674348
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KEYWORDS
Dielectrics
Electric fields
Epoxies
Capacitors
Power grids
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