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We propose a snapshot uniaxial 3D profilometry system that illuminates a sample with a color structured polarization pattern with axial chromatic aberration. We have previously shown that real-time 3D shape measurement can be performed without the occlusion problem using a RGB polarization camera and a monochromatic polarized pattern. Here we show that it is possible to double the depth range of the system, with no tradeoff in depth resolution, measurement speed, or accuracy, by using color pattern projection and an RGB polarization camera. We present the measurement principles of the system and show the results of a real-time 3D profilometry experiment.
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Yukitoshi Otani, Yuuki Maeda, Nathan A. Hagen, "Snapshot 3D profilometry using a RGB polarization camera," Proc. SPIE 12618, Optical Measurement Systems for Industrial Inspection XIII, 1261807 (16 August 2023); https://doi.org/10.1117/12.2681681