Coaxial deflectometry: absolute shape measurement with interferometric accuracy

Yves Surrel; Maxime Bordoux

doi:10.1117/12.2673699

10 August 2023 Coaxial deflectometry: absolute shape measurement with interferometric accuracy

Yves Surrel, Maxime Bordoux

Proceedings Volume 12618, Optical Measurement Systems for Industrial Inspection XIII; 126182H (2023) https://doi.org/10.1117/12.2673699
Event: SPIE Optical Metrology, 2023, Munich, Germany

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Yves Surrel and Maxime Bordoux "Coaxial deflectometry: absolute shape measurement with interferometric accuracy", Proc. SPIE 12618, Optical Measurement Systems for Industrial Inspection XIII, 126182H (10 August 2023); https://doi.org/10.1117/12.2673699

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