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5 October 2023 Absolute surface metrology of x-ray telescope mirrors through axial shift mapping
Hayden J. Wisniewski, Ralf K. Heilmann, Mark L. Schattenburg, Brandon D. Chalifoux
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Proceedings Volume 12679, Optics for EUV, X-Ray, and Gamma-Ray Astronomy XI; 126790Q (2023) https://doi.org/10.1117/12.2677596
Event: SPIE Optical Engineering + Applications, 2023, San Diego, California, United States
Abstract
The next generation of x-ray telescopes will require mirror segments to be characterized to a surface uncertainty of 5 nm RMS or better. We present axial shift mapping, a Fizeau interferometry method to characterized near-cylindrical null correctors and surfaces. We extend our previously tested technique to cylindrical optics of similar dimensions to x-ray telescope mirrors. We report on progress towards full surface extraction of a cylindrical optic using axial shift mapping.
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(2023) Published by SPIE. Downloading of the abstract is permitted for personal use only.
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Hayden J. Wisniewski, Ralf K. Heilmann, Mark L. Schattenburg, and Brandon D. Chalifoux "Absolute surface metrology of x-ray telescope mirrors through axial shift mapping", Proc. SPIE 12679, Optics for EUV, X-Ray, and Gamma-Ray Astronomy XI, 126790Q (5 October 2023); https://doi.org/10.1117/12.2677596
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KEYWORDS
Computer generated holography
Optical surfaces
X-ray telescopes
Metrology
Fizeau interferometers
X-rays
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