JPSS J2 Spectralon performance pre-launch

Vijay Murgai; James J. Butler; Xiaoxiong Xiong

doi:10.1117/12.2676083

4 October 2023 JPSS J2 Spectralon performance pre-launch

Vijay Murgai, James J. Butler, Xiaoxiong Xiong

Proceedings Volume 12685, Earth Observing Systems XXVIII; 1268508 (2023) https://doi.org/10.1117/12.2676083
Event: SPIE Optical Engineering + Applications, 2023, San Diego, California, United States

Abstract

Spectralon® is a high reflectance excellent diffuser used to reflect sunlight for use as a calibrator for on-orbit and ground instruments. Radiometric calibration of the reflective bands in the 0.4 to 2.5μm wavelength range is performed by measuring the sunlight reflected from Spectralon®. Reflected sunlight is directly proportional to the Bidirectional Reflectance Distribution Function (BRDF) of the Spectralon®. On-orbit exposure to sunlight results in solarization due to solar UV and the presence of residual contamination. Spectralon® quality is checked at start of build by measuring the change in reflectance on exposing a witness sample to 100 hours Solar UV as an indication of on orbit performance. For JPSS J2, the witness samples accompanied the sensor till 30 days before launch. Measuring the reflectance change on exposure to Solar UV of the witness samples accompanying the sensor through build and test is a better indication of on orbit performance as this includes any additional contamination during the build and test phase.

Conference Presentation

(2023) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Vijay Murgai, James J. Butler, and Xiaoxiong Xiong "JPSS J2 Spectralon performance pre-launch", Proc. SPIE 12685, Earth Observing Systems XXVIII, 1268508 (4 October 2023); https://doi.org/10.1117/12.2676083

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