Paper
26 May 2023 Design of low-frequency phase meter based on STM32 single chip microcomputer
Chengquan Liang, Junsheng Qin
Author Affiliations +
Proceedings Volume 12700, International Conference on Electronic Information Engineering and Data Processing (EIEDP 2023); 127000S (2023) https://doi.org/10.1117/12.2682335
Event: International Conference on Electronic Information Engineering and Data Processing (EIEDP 2023), 2023, Nanchang, China
Abstract
A low-frequency phase meter based on STM32 single-chip microcomputer is designed for the characteristics of expensive, complex functions and inconvenient portability of the phase meters on the market. The phase meter is mainly composed of STM32 single-chip microcomputer module, amplification and shaping module, display module, power supply module and so on. The article first introduces the design background and goals of the phase meter; secondly, introduces the overall design scheme and the selection of each module; thirdly, makes a real object for frequency and phase function tests; finally, makes a design summary. Experiments show that the frequency and phase measurement errors of the low-frequency phase meter are small, and the expected design goal is achieved. At the same time, the phase meter can measure a variety of waveforms, with low production costs and easy portability.
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Chengquan Liang and Junsheng Qin "Design of low-frequency phase meter based on STM32 single chip microcomputer", Proc. SPIE 12700, International Conference on Electronic Information Engineering and Data Processing (EIEDP 2023), 127000S (26 May 2023); https://doi.org/10.1117/12.2682335
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KEYWORDS
Design and modelling

Phase measurement

Organic light emitting diodes

LCDs

Power supplies

Capacitors

Error analysis

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