Paper
18 July 2023 Data mining and analysis for defects of secondary equipment in power grid
Mingjing Zhao, Bo Wang, Yanghui Zu, Dan Wang, Zhixiong Liu
Author Affiliations +
Proceedings Volume 12722, Third International Conference on Mechanical, Electronics, and Electrical and Automation Control (METMS 2023); 1272224 (2023) https://doi.org/10.1117/12.2679356
Event: International Conference on Mechanical, Electronics, and Electrical and Automation Control (METMS 2023), 2023, Hangzhou, China
Abstract
In order to effectively maintain and operate the smart substations, a data mining and analysing method for defects of secondary equipment based on the FP-Growth algorithm is proposed.The basic ideas of association rules and FP-Growth algorithm are introduced firstly, then the defect model and the system framework are proposed to mine and analyze the defect data. Through the analysis of the actual defect data of a substation using the proposed method, it shows that the proposed method can effectively find the relationship among secondary devices, manufactories, defect properties, defect causes and other factors. By data mining, it can provide valuable information for efficient maintaining and operation of the substations. Some auxiliary suggestions are given for operation of secondary device finally.
© (2023) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mingjing Zhao, Bo Wang, Yanghui Zu, Dan Wang, and Zhixiong Liu "Data mining and analysis for defects of secondary equipment in power grid", Proc. SPIE 12722, Third International Conference on Mechanical, Electronics, and Electrical and Automation Control (METMS 2023), 1272224 (18 July 2023); https://doi.org/10.1117/12.2679356
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KEYWORDS
Mining

Data mining

Data modeling

Power grids

Displays

Manufacturing

Manufacturing equipment

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