Optimization of adaptive digital fringe method in PMD

Yan Xie; Qian Zhou; Xiaohao Wang

doi:10.1117/12.2687268

27 November 2023 Optimization of adaptive digital fringe method in PMD

Yan Xie, Qian Zhou, Xiaohao Wang

Proceedings Volume 12769, Optical Metrology and Inspection for Industrial Applications X; 127690V (2023) https://doi.org/10.1117/12.2687268
Event: SPIE/COS Photonics Asia, 2023, Beijing, China

Abstract

When using Phase Measurement Deflectometry (PMD) to measure a surface with multiple levels of reflectivity, complete phase information can be obtained by reducing exposure. This enables point-to-point mapping of the imaging surface and projection surface. Through these operations, adjustments can be made to the intensity of the light source, resulting in the division of the light source into regions. The ultimate goal is to achieve high-precision phase measurement of objects with multiple levels of reflectivity. However, the adjustment of light intensity at the location of sudden changes in reflectivity can lead to mutual interference between adjacent¹ reflectivity regions. Due to the fact that the focusing surface of the camera is usually on the measuring surface, the position of the display is away from the focus. This results in a point on the imaging surface corresponding to diffuse plaques on the display. The intensity of the light source within the diffuse plaques can impact the imaging intensity. Therefore, imaging points located at the edge are highly susceptible to the influence of modulation intensity on both sides, resulting in darker low reflectivity areas at the edge, brighter high reflectivity areas at the edge, and even overexposure. In order to solve this problem, this paper analyzed the defocusing situation of the system and eliminates this influence through optical methods.

(2023) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Yan Xie, Qian Zhou, and Xiaohao Wang "Optimization of adaptive digital fringe method in PMD", Proc. SPIE 12769, Optical Metrology and Inspection for Industrial Applications X, 127690V (27 November 2023); https://doi.org/10.1117/12.2687268

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
9 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Light sources

Cameras

Image processing

Fringe analysis

Imaging systems

Phase shifts

Mirror surfaces

Show All Keywords

Keywords/Phrases

Search In:

Publication Years