Application of PT-symmetry in metasurfaces for measuring the inclination angle

E. A. Efremova; I. R. Krylov; U. V. Prokhorova; E. V. Shalymov; V. I. Shoev; V. Yu. Venediktov; A. A. Zinchik

doi:10.1117/12.2686512

28 November 2023 Application of PT-symmetry in metasurfaces for measuring the inclination angle

E. A. Efremova, I. R. Krylov, U. V. Prokhorova, E. V. Shalymov, V. I. Shoev, V. Yu. Venediktov, A. A. Zinchik

Proceedings Volume 12773, Nanophotonics and Micro/Nano Optics IX; 1277306 (2023) https://doi.org/10.1117/12.2686512
Event: SPIE/COS Photonics Asia, 2023, Beijing, China

Abstract

The purpose of this study is to develop an optical inclination angle sensor using a metasurface as a scale. We propose to use the dependence of the reflection or transmission spectrum of the metasurface on the direction of light incident on it to measure the inclination angle. The disadvantages of this approach when using the simplest completely passive metasurfaces are considered. In particular, the use of bulky devices to scan the spectrum of the structure. As an alternative, the possibility of using metasurfaces with parity-time-symmetry properties to measure the inclination angle is proposed and investigated. Then no spectrum scanning of the metasurface is required to perform inclination angle measurements. As an example, a metastructure formed by two optically coupled subwavelength diffraction gratings (one of which is characterized by losses, and the other by gain) with a rectangular stroke profile is considered. The study is based on computer modeling by the finite element method.

(2023) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

E. A. Efremova, I. R. Krylov, U. V. Prokhorova, E. V. Shalymov, V. I. Shoev, V. Yu. Venediktov, and A. A. Zinchik "Application of PT-symmetry in metasurfaces for measuring the inclination angle", Proc. SPIE 12773, Nanophotonics and Micro/Nano Optics IX, 1277306 (28 November 2023); https://doi.org/10.1117/12.2686512

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KEYWORDS

Reflection

Refractive index

Dielectrics

Diffraction gratings

Sensors

Diffraction

Optical properties

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