Carrier localization induced size-immunity behavior of green InGaN/GaN micro-light-emitting diodes

Woo Jin Baek; Juhyuk Park; Hyun Soo Kim; Dae-Myeong Geum; Sang Hyeon Kim

doi:10.1117/12.3000616

8 March 2024 Carrier localization induced size-immunity behavior of green InGaN/GaN micro-light-emitting diodes

Woo Jin Baek, Juhyuk Park, Hyun Soo Kim, Dae-Myeong Geum, Sang Hyeon Kim

Proceedings Volume 12886, Gallium Nitride Materials and Devices XIX; 128860D (2024) https://doi.org/10.1117/12.3000616
Event: SPIE OPTO, 2024, San Francisco, California, United States

Abstract

We investigated the carrier localization effect in μLEDs with low (blue) and high (green) indium composition quantum wells through the intensive analysis of the size-dependent forward bias current and electroluminescence mapping. We have observed a negative surface current and high electroluminescence intensity in random spots in green μLEDs, indicating the existence of a converging current to the deep well. On the other hand, in blue μLEDs, we observed a diverging current towards the mesa sidewall. We experimentally confirmed through EQE and J_{max EQE} that the converging current caused by carrier localization in green μLEDs is responsible for the size-immunity properties in green μLEDs.

Conference Presentation

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Woo Jin Baek, Juhyuk Park, Hyun Soo Kim, Dae-Myeong Geum, and Sang Hyeon Kim "Carrier localization induced size-immunity behavior of green InGaN/GaN micro-light-emitting diodes", Proc. SPIE 12886, Gallium Nitride Materials and Devices XIX, 128860D (8 March 2024); https://doi.org/10.1117/12.3000616

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