Presentation + Paper
15 March 2024 Heteroepitaxy and annealing studies of orthorhombic gallium oxide films on nanostructured AlN templates
Author Affiliations +
Proceedings Volume 12887, Oxide-based Materials and Devices XV; 1288709 (2024) https://doi.org/10.1117/12.3001597
Event: SPIE OPTO, 2024, San Francisco, California, United States
Abstract
We report on the growth and characterization of κ-Ga2O3 films grown at varying temperatures in the range of 450-700 ˚C by mist-CVD. All of the films are single-crystalline and phase-pure except for the two samples grown at 550 ˚C and 600 ˚C, which have (2̅ 01)-oriented β-Ga2O3 incorporated in them. Unlike the phase-pure films which exhibit hexagonal-shaped grains, the mixed-phase samples have rough and partially coalesced films with irregular-shaped grains due to the presence of two Ga2O3 phases growing along two different crystallographic orientations. Moreover, we found that annealing the κ-Ga2O3 films at 700 ˚C in ambient air led to improved crystalline quality and reduced grain size.
Conference Presentation
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Yara Banda, Seong-Ho Cho, Yanqing Jia, Mohamed Ben Hassine, Bambar Davaasuren, Qingxiao Wang, Si-Young Bae, Tien Khee Ng, and Boon S. Ooi "Heteroepitaxy and annealing studies of orthorhombic gallium oxide films on nanostructured AlN templates", Proc. SPIE 12887, Oxide-based Materials and Devices XV, 1288709 (15 March 2024); https://doi.org/10.1117/12.3001597
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KEYWORDS
Crystals

Annealing

Scanning electron microscopy

Gallium

Gallium oxide

Crystallography

Heteroepitaxy

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